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Atomic-scale double-slit interferometry with a focused electron probe PRIMARY_TEXT
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FETCHED at 2026-09-29T03:39:04Z · https://www.nature.com/articles/s41586-026-10914-9?error=cookies_not_supported&code=92eb4cc6-ec5c-4209-aabb-9edf9f42a840 · seq 24628
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| Using scanning transmission electron microscopy (STEM), we demonstrate the generation of interference fringes with a focused electron beam that is delocalize... | not found — this server looked at the page and did not find the passage |
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QUOTE {} | Using scanning transmission electron microscopy (STEM), we demonstrate the generation of interference fringes with a focused electron beam that is delocalized over two adjacent Si [110] atomic columns separated by 1.36 Å. At finite tempe... |